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Scanning Electron Microscopy and X-Ray Microanalysis

Third Edition

Goldstein, Joseph/Newbury, Dale E/Joy, David C et al
Erschienen am 31.01.2003, 3. Auflage 2007
117,69 €
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Bibliografische Daten
ISBN/EAN: 9780306472923
Sprache: Englisch
Umfang: xix, 689 S.
Format (T/L/B): 5 x 26 x 18.5 cm
Einband: gebundenes Buch

Beschreibung

The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities in every corner of the globeThe authors have made extensive changes to the text and figures in this edition as a result of their experience in teaching the various concepts of SEM and x-ray microanalysis

Produktsicherheitsverordnung

Hersteller:
Springer Verlag GmbH
juergen.hartmann@springer.com
Tiergartenstr. 17
DE 69121 Heidelberg

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