Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.

Topics include:
Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale

Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information

N. John DiNardo is the author of Nanoscale Characterization of Surfaces and Interfaces, published by Wiley.

Introduction
Scanning Tunneling Microscopy (STM)
Atomic Force Microscopy/
Manipulation of Atoms and Atom Clusters on the Nanoscale
Spin.Offs of STM -
Non-Contact Nanoscale Probes
Acknowledgements
References